
Ubuntu日本語フォーラム
ログインしていません。
http://cdimage.ubuntulinux.jp/releases/7.04/ubuntu-ja-7.04-desktop-i386.iso.torrent
を使ってDLしたISOがCDに焼けません。
右クリックして出るメニューの「ここに展開する」で"Input/Output Error"みたいな感じのメッセージが出ます。
"md5sum ubuntu-ja-7.04-desktop-i386.iso"でチェックしようとしても同じです。
強引に展開してISOの中にある"md5sum.txt"でチェックすると、"./casper/filesystem.squashfs"だけ失敗します。
ISOを直接DLして焼こうとしてもうまくいきませんでした。
上記の作業は全てUbuntu-Feisty上で行いました。
オフライン
ダウンロードしたそのハードディスクに何か問題はありませんか?
念のため、お使いのハードディスクのメーカーから提供されているチェックプログラムを実行されることをおすすめします。
その場合以前hitoさんから教えていただいた、このCDイメージが役に立つかもしれません。
http://www.ultimatebootcd.com/
オフライン
>念のため、お使いのハードディスクのメーカーから提供されているチェックプログラムを実行されることをおすすめします。
チェックプログラムの事はよくわかりませんが、smartctlを実行してみました。
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus family
Device Model: ST3120026A
Serial Number: 4JT0LMZY
Firmware Version: 8.01
User Capacity: 120,034,123,776 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2
Local Time is: Sun Jun 3 21:20:20 2007 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 064 063 006 Pre-fail Always - 93300904
3 Spin_Up_Time 0x0003 096 096 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 6
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 14
7 Seek_Error_Rate 0x000f 077 060 030 Pre-fail Always - 54950201
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 3307
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 970
194 Temperature_Celsius 0x0022 032 040 000 Old_age Always - 32
195 Hardware_ECC_Recovered 0x001a 064 062 000 Old_age Always - 93300904
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 2
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 2
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 TA_Increase_Count 0x0032 099 252 000 Old_age Always - 1
SMART Error Log Version: 1
ATA Error Count: 37 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 37 occurred at disk power-on lifetime: 3306 hours (137 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 a2 7a e3 e0 Error: UNC at LBA = 0x00e37aa2 = 14908066
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 9f 7a e3 e0 00 01:47:09.465 READ DMA EXT
35 00 00 b7 ec 25 e0 00 01:47:09.455 WRITE DMA EXT
35 00 00 b7 e8 25 e0 00 01:47:09.445 WRITE DMA EXT
35 00 00 b7 e4 25 e0 00 01:47:09.436 WRITE DMA EXT
35 00 00 b7 e0 25 e0 00 01:47:09.431 WRITE DMA EXT
Error 36 occurred at disk power-on lifetime: 3306 hours (137 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 a2 7a e3 e0 Error: UNC at LBA = 0x00e37aa2 = 14908066
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 9f 7a e3 e0 00 01:15:00.733 READ DMA EXT
35 00 00 a7 2c 21 e0 00 01:15:00.732 WRITE DMA EXT
35 00 00 a7 28 21 e0 00 01:15:00.823 WRITE DMA EXT
35 00 00 a7 24 21 e0 00 01:15:00.814 WRITE DMA EXT
35 00 00 a7 20 21 e0 00 01:15:00.804 WRITE DMA EXT
Error 35 occurred at disk power-on lifetime: 3305 hours (137 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 a2 7a e3 e0 Error: UNC at LBA = 0x00e37aa2 = 14908066
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 9f 7a e3 e0 00 01:10:10.375 READ DMA EXT
35 00 00 ef c0 df e0 00 01:10:10.340 WRITE DMA EXT
35 00 08 c7 be df e0 00 01:10:10.338 WRITE DMA EXT
35 00 00 c7 ba df e0 00 01:10:10.332 WRITE DMA EXT
35 00 00 c7 b6 df e0 00 01:10:10.326 WRITE DMA EXT
Error 34 occurred at disk power-on lifetime: 3305 hours (137 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 a2 7a e3 e0 Error: UNC at LBA = 0x00e37aa2 = 14908066
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 9f 7a e3 e0 00 01:07:41.591 READ DMA EXT
35 00 00 a7 06 de e0 00 01:07:41.584 WRITE DMA EXT
35 00 00 a7 02 de e0 00 01:07:41.578 WRITE DMA EXT
35 00 00 a7 fe dd e0 00 01:07:41.573 WRITE DMA EXT
35 00 00 a7 fa dd e0 00 01:07:41.560 WRITE DMA EXT
Error 33 occurred at disk power-on lifetime: 3305 hours (137 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 a2 7a e3 e0 Error: UNC at LBA = 0x00e37aa2 = 14908066
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 9f 7a e3 e0 00 00:56:30.436 READ DMA EXT
35 00 08 8f 00 20 e0 00 00:56:30.436 WRITE DMA EXT
35 00 08 3f 00 20 e0 00 00:56:30.436 WRITE DMA EXT
35 00 38 1f 81 e6 e0 00 00:56:30.436 WRITE DMA EXT
35 00 08 7f 80 e6 e0 00 00:56:30.436 WRITE DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
これってマズイんですかね…?
ディスクに問題があるんでしょうか。
オフライン
smartctlの出力をまじまじと見るのは久々だったりしますが(苦笑)
SMARTでは255の値を最良,0を最悪(つまり壊れた状態)として、各属性を表記しています。
各属性の説明については、
http://www.geocities.jp/sugachan1973/doc/funto57.html
http://ja.wikipedia.org/wiki/Self-Monitoring,_Analysis_and_Reporting_Technology
が良い情報源だと思います。smartの値や意味はメーカによってすこしづつ違ったりしているようですが。
まだ使えるとsmartctrlの検証結果では出てはいるものの記録された5つのエラーはこの記録をとった1-2時間のうちに出ていますね....
>> Error 37 occurred at disk power-on lifetime: 3306 hours (137 days + 18 hours)
>> Error 36 occurred at disk power-on lifetime: 3306 hours (137 days + 18 hours)
>> Error 35 occurred at disk power-on lifetime: 3305 hours (137 days + 17 hours)
>> Error 34 occurred at disk power-on lifetime: 3305 hours (137 days + 17 hours)
>> Error 33 occurred at disk power-on lifetime: 3305 hours (137 days + 17 hours)
わりとエラーも出てます。
>> 1 Raw_Read_Error_Rate 0x000f 064 063 006 Pre-fail Always - 93300904
>> 7 Seek_Error_Rate 0x000f 077 060 030 Pre-fail Always - 54950201
>>195 Hardware_ECC_Recovered 0x001a 064 062 000 Old_age Always - 93300904
その他を見ると通電時間 3307時間、電源のOn/Off回数 970回。このドライブが最初に出たのは2003年頃?
ほぼ毎日電源を入れたとして3年程度、1回電源を入れると3時間程度は使ってきたということですが、そろそろお役御免の時期かもしれません。
そういえば、私のマシンは最近カーネルをあげたタイミングでSMART情報が見えなくなってしまいました(IDEなのに/dev/sdaと認識される)。これはチップセットがSISのときだけみたいなんですが、なんとかならんもんか。
オフライン
>smartctlの出力をまじまじと見るのは久々だったりしますが(苦笑)
すいません(笑)
勉強不足なもので意味もわからず貼り付けてしまいました。
>そろそろお役御免の時期かもしれません。
マジですか?
寿命だとは思いますが残念です。
ISOですが、再度DLしたらmd5sumチェックもうまくいき、ちゃんと焼けました。
ありがとうございました。
オフライン
久々に資料を読み直してしまいましたが、頭の埃を払うにはちょうど良かったです:)
> ISOですが、再度DLしたらmd5sumチェックもうまくいき、ちゃんと焼けました。
まずは良かったです。障害の発生した場所を避けてイメージが作られたってことかもしれませんね。
smartctlの内容はこまめにちぇっくしてあげたほうがいいかもしれませんね。
ところで、オフとピックですが先の投稿の私の愚痴、
$ smartctl -d ata /dev/sda
などとすれば見えました。SATAのディスクをお使いの方もこれで。
仕返し、じゃない....参考までに私の結果も貼っておきます。
# smartctl -a -d ata /dev/sda smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: Hitachi HDS721616PLAT80 Serial Number: PV3300Z2S9KKLJ Firmware Version: P22OA60A User Capacity: 164,696,555,520 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1 Local Time is: Mon Jun 4 00:14:26 2007 JST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (2865) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 48) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 099 099 016 Pre-fail Always - 131072 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 253 253 024 Pre-fail Always - 75 (Average 75) 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 159 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 571 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 159 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 167 193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 167 194 Temperature_Celsius 0x0002 150 150 000 Old_age Always - 40 (Lifetime Min/Max 14/53) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
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